Tag Archive for development

GOM 3D Metrology Conference 2015

This year’s GOM 3D Metrology Conference will show in user presentations, live demonstrations and the accompanying trade show, how optical measuring systems shorten development cycles and improve production processes.

AICON’s stereoSCAN neo: See what you measure!

Scanning the surface of an object and display the deviations from CAD in color directly on the component – this new technology stands behind the ‘neo’ in the name of our white light scanner stereoSCAN neo.

Smiles Better — Haas Customer Success Story

The parts used in dental restorations travel from the machine shop to the dentist via the dental lab. But, as in many other areas of business and commerce, the middleman is being squeezed, as costs climb and technology offers alternatives to the traditional ways. And this is the scenario for the unfortunate dental technician. The…

EOS launches the EOS M 290 Metal System to succeed the established EOSINT M 280 System

The Metal Additive Manufacturing (AM) system sets new standards, offers extensive quality management features and expanded monitoring capabilitiesEOS, the global technology and quality leader for high-end Additive Manufacturing (AM) solutions, at this year‘s Rapid.Tech launched its new EOS M 290 system, the successor to the established and market-leading EOSINT M 280, designed for the tool-free…

Renishaw’s new pioneering encoder boldly goes into space

Renishaw, the global metrology specialist, has reached another milestone in the application of its technology by deploying products in space for the first time. The European Space Agency’s Sentinel-1A satellite was launched from the European spaceport in Kourou, French Guiana, on April 3rd 2014, with Renishaw’s new space-encoder technology installed on the advanced Optical Communications…